Journal of Applied Mathematics and Decision Sciences
Volume 2 (1998), Issue 2, Pages 193-199

Technical Note: An investigation of chaos in the RL-diode circuit using the BDS test

R. Kasap1 and E. Kurt2

1Department of Statistics, Gazi University, Ankara, Turkey
2Department of Physics Education, Gazi University, Ankara, Turkey

Copyright © 1998 R. Kasap and E. Kurt. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


In this paper, RL-diode circuit driven by a sinusoidal voltage is employed to obtain nonlinear experimental data. The BDS test statistic is used to analyse these data. According to the results of the analysis for the first differenced order data, chaotic structure has been found for each e values.