Journal of Applied Mathematics and Decision Sciences
Volume 6 (2002), Issue 4, Pages 203-212

Goodness-of-fit tests based on sample space partitions: a unifying overview

O. Thas and J. P. Ottoy

Department of Applied Mathematics Biometrics and Process Control Ghent University, Gent B-9000, Belgium

Copyright © 2002 O. Thas and J. P. Ottoy. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Recently the authors have proposed tests for the one-sample and the κ-sample problem, and a test for independence. All three tests are based on sample space partitions, but they were originally developed in different papers. Here we give an overview of the construction of these tests, stressing the common underlying concept of “sample space partitions.”