Academic Editor: Harvinder S. Sidhu
Copyright © 2010 Howard Jacobowitz and Scott D. Metzler. This is an open access article distributed under the
Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Geometric sensitivity for single photon emission computerized tomography
(SPECT) is given by a double integral over the detection plane. It
would be useful to be able to explicitly evaluate this quantity. This paper
shows that the inner integral can be evaluated in the situation where
there is no gamma ray penetration of the material surrounding the pinhole
aperture. This is done by converting the integral to an integral in
the complex plane and using Cauchy's theorem to replace it by one which
can be evaluated in terms of elliptic functions.